The committee's charter is defined in its Terms Of Reference [PDF].
Terms of Reference is subject to change

Active Projects0
Constitution0
International Relationships0
Published Standards0
Sub Committees0
Active Projects 0
Constitution 8
International Relationships 0
Published Standards 41
Sub Committees 6
  • This is a list of projects currently being worked on by Standards Australia's Standards Development Team.

    There are no active projects for this committee

  • The constitution of a Technical Committee consists of the Nominating Organisations that represent various interest groups across the industries. These Nominating Organisations are currently participating in Standards Australia’s Standards Development activity. The Nominating Organisation appoints a representative to represent the views of that organisation’s interest group during the development of a Standard.

    Constitution
     
  • Standards Australia participates in Standards development with the International standards bodies as listed below.

    For further information on ISO relationships please visit ISO’s website www.iso.org

    For further information on IEC relationships please visit IEC’s website www.iec.ch

    There are no international relationships for this committee

  • Below is the list of current Standards developed and published by Standards Australia. This list does not display the obsolete, superseded, available superseded and withdrawn Standards. The published Standards are documents that set out specifications and procedures designed to ensure products, services and systems are safe, reliable and consistently perform the way they are intended to.

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    Designation
    Publication Title
    • AS 2134.1-1999

      Recommended practice for chemical analysis by atomic absorption spectrometry - Flame atomic absorption spectrometry

    • AS 2134.1-1999 Rec:2016

      Recommended practice for chemical analysis by atomic absorption spectrometry - Part 1: Flame atomic absorption spectrometry

    • AS 2134.2-1999

      Recommended practice for chemical analysis by atomic absorption spectrometry - Graphite furnace spectrometry

    • AS 2134.2-1999 Rec:2016

      Recommended practice for chemical analysis by atomic absorption spectrometry - Part 2: Graphite furnace spectrometry

    • AS 2134.3-1994

      Recommended practice for chemical analysis by atomic absorption spectrometry - Vapour generation atomic absorption spectrometry

    • AS 2134.3-1994 Rec:2016

      Recommended practice for chemical analysis by atomic absorption spectrometry - Part 3: Vapour generation atomic absorption spectrometry

    • AS 3641.1-1999

      Recommended practice for atomic emission spectrometric analysis - Principles and techniques

    • AS 3641.1-1999 Rec:2016

      Recommended practice for atomic emission spectrometric analysis - Part 1: Principles and techniques

    • AS 3641.2-1999

      Recommended practice for atomic emission spectrometric analysis - Inductively coupled plasma excitation

    • AS 3641.2-1999 Rec:2016

      Recommended practice for atomic emission spectrometric analysis - Part 2: Inductively coupled plasma excitation

    • AS 3685-1998

      Recommended procedures and principles of glow discharge mass spectrometry (GD-MS)

    • AS 3685-1998 Rec:2016

      Recommended procedures and principles of glow discharge mass spectrometry (GD-MS)

    • AS 3753-2001

      Recommended practice for chemical analysis by ultraviolet/visible spectrophotometry

    • AS 3753-2001 Rec:2016

      Recommended practice for chemical analysis by ultraviolet/visible spectrophotometry

    • AS 4873.1-2005

      Recommended practice for inductively coupled plasma-mass spectrometry (ICP-MS) - Principles and techniques

    • AS 4873.2-2009

      Recommended practice for inductively coupled plasma mass spectrometry (ICP-MS) - Quantitative determination - Water

    • AS ISO 14237-2006

      Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

    • AS ISO 14606-2006

      Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials

    • AS ISO 14975-2006

      Surface chemical analysis - Information formats

    • AS ISO 14975-2006 Rec:2016

      Surface chemical analysis - Information formats

    • AS ISO 14976-2006

      Surface chemical analysis - Data transfer format

    • AS ISO 14976-2006 Rec:2016

      Surface chemical analysis - Data transfer format

    • AS ISO 15470-2006

      Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

    • AS ISO 15470-2006 Rec:2016

      Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

    • AS ISO 15472-2006

      Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

    • AS ISO 17560-2006

      Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon

    • AS ISO 17974-2006

      Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis

    • AS ISO 17974-2006 Rec:2016

      Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis

    • AS ISO 18114-2006

      Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials

    • AS ISO 18114-2006 Rec:2016

      Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials

    • AS ISO 18115-2006

      Surface chemical analysis - Vocabulary

    • AS ISO 18116-2006

      Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis

    • AS ISO 18116-2006 Rec:2016

      Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis

    • AS ISO 18118-2006

      Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

    • AS ISO 19318-2006

      Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction

    • AS ISO 19318-2006 Rec:2016

      Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction

    • AS ISO 19319-2006

      Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser

    • AS ISO 22048-2006

      Surface chemical analysis - Information format for static secondary-ion mass spectrometry

    • AS ISO 22048-2006 Rec:2016

      Surface chemical analysis - Information format for static secondary-ion mass spectrometry

    • AS ISO 24237-2006

      Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale

    • AS ISO 24237-2006 Rec:2016

      Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale

  • The Sub Committees within the Technical Committee are listed here.

    Sub Committees